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      Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

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      Author
      Atabak, M.
      Ünverdi O.
      Özer H.O.
      Oral, A.
      Date
      2009
      Source Title
      Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
      Print ISSN
      10711023
      Volume
      27
      Issue
      2
      Pages
      1001 - 1005
      Language
      English
      Type
      Article
      Item Usage Stats
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      74
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      Abstract
      In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface. © 2009 American Vacuum Society.
      Keywords
      Atomic forces
      Atomic steps
      Force gradients
      Lateral forces
      Lateral stiffness
      Lateral-force microscopies
      Noncontact
      Off resonances
      Quantitative investigations
      Sharp increase
      Si (1 1 1)
      Tip-surface interactions
      Tungsten tips
      Tunnel currents
      Scanning
      Scanning tunneling microscopy
      Silicon
      Tungsten
      Stiffness
      Permalink
      http://hdl.handle.net/11693/22773
      Published Version (Please cite this version)
      http://dx.doi.org/10.1116/1.3097857
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      • Department of Physics 2339
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