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dc.contributor.authorYagbasan, A.en_US
dc.contributor.authorTunc, C. A.en_US
dc.contributor.authorErturk V. B.en_US
dc.contributor.authorAltintas, A.en_US
dc.contributor.authorMittra, R.en_US
dc.date.accessioned2016-02-08T09:58:53Z
dc.date.available2016-02-08T09:58:53Z
dc.date.issued2010-3-1en_US
dc.identifier.issn0018-926X
dc.identifier.urihttp://hdl.handle.net/11693/22342
dc.description.abstractA computationally efficient algorithm, which combines the characteristic basis function method (CBFM), the physical optics (PO) approach (when applicable) with the forward backward method (FBM), is applied for the investigation of electromagnetic scattering fromand propagation overlarge-scale rough terrain problems. The algorithm utilizes high-level basis functions defined on macro-domains (blocks), called the characteristic basis functions (CBFs) that are constructed by aggregating low-level basis functions (i.e., conventional sub-domain basis functions). The FBM as well as the PO approach (when applicable) are used to construct the aforementioned CBFs. The conventional CBFM is slightly modified to handle large-terrain problems, and is further embellished by accelerating it, as well as reducing its storage requirements, via the use of an extrapolation procedure. Numerical results for the total fields, as well as for the path loss are presented and compared with either measured or previously published reference solutions to assess the efficiency and accuracy of the algorithm.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Antennas and Propagationen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TAP.2010.2044334en_US
dc.subjectCharacteristic basis functions (CBFs)en_US
dc.subjectElectromagnetic scatteringen_US
dc.subjectForward-backward method (FBM)en_US
dc.subjectMethod of moments (MoM)en_US
dc.subjectTerrain propagationen_US
dc.titleCharacteristic basis function method for solving electromagnetic scattering problems over rough terrain profilesen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage1579en_US
dc.citation.epage1589en_US
dc.citation.volumeNumber58en_US
dc.citation.issueNumber5en_US
dc.identifier.doi10.1109/TAP.2010.2044334en_US
dc.publisherIEEEen_US


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