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dc.contributor.authorDagdas, Yavuz S.en_US
dc.contributor.authorAslan, M. N.en_US
dc.contributor.authorTekinay, Ayse B.en_US
dc.contributor.authorGüler, Mustafa O.en_US
dc.contributor.authorDâna, Aykutluen_US
dc.date.accessioned2016-02-08T09:51:57Z
dc.date.available2016-02-08T09:51:57Z
dc.date.issued2011en_US
dc.identifier.issn0957-4484
dc.identifier.urihttp://hdl.handle.net/11693/21851
dc.description.abstractWe demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers. © 2011 IOP Publishing Ltd.en_US
dc.language.isoEnglishen_US
dc.source.titleNanotechnologyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/0957-4484/22/29/295704en_US
dc.titleNanomechanical characterization by double-pass force-distance mappingen_US
dc.typeArticleen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentAysel Sabuncu Brain Research Center (BAM)en_US
dc.citation.spage295704-1en_US
dc.citation.epage295704-5en_US
dc.citation.volumeNumber22en_US
dc.citation.issueNumber29en_US
dc.identifier.doi10.1088/0957-4484/22/29/295704en_US
dc.publisherInstitute of Physics Publishingen_US
dc.contributor.bilkentauthorDagdas, Yavuz S.
dc.contributor.bilkentauthorTekinay, Ayse B.
dc.contributor.bilkentauthorGüler, Mustafa O.
dc.contributor.bilkentauthorDâna, Aykutlu
dc.identifier.eissn1361-6528


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