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dc.contributor.authorGuldogan, M. B.en_US
dc.contributor.authorArikan, O.en_US
dc.date.accessioned2016-02-08T09:36:17Z
dc.date.available2016-02-08T09:36:17Z
dc.date.issued2013en_US
dc.identifier.issn1051-2004
dc.identifier.urihttp://hdl.handle.net/11693/20838
dc.description.abstractIn this paper, a novel algorithm is proposed to achieve robust high resolution detection in sparse multipath channels. Currently used sparse reconstruction techniques are not immediately applicable in multipath channel modeling. Performance of standard compressed sensing formulations based on discretization of the multipath channel parameter space degrade significantly when the actual channel parameters deviate from the assumed discrete set of values. To alleviate this off-grid problem, we make use of the particle swarm optimization (PSO) to perturb each grid point that reside in each multipath component cluster. Orthogonal matching pursuit (OMP) is used to reconstruct sparse multipath components in a greedy fashion. Extensive simulation results quantify the performance gain and robustness obtained by the proposed algorithm against the off-grid problem faced in sparse multipath channels.en_US
dc.language.isoEnglishen_US
dc.source.titleDigital Signal Processing: A Review Journalen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.dsp.2013.03.003en_US
dc.subjectChannel identificationen_US
dc.subjectCompressed sensing (CS)en_US
dc.subjectCross-ambiguity function (CAF)en_US
dc.subjectOrthogonal matching pursuit (OMP)en_US
dc.subjectParticle swarm optimization (PSO)en_US
dc.subjectSparse approximationen_US
dc.subjectChannel identificationen_US
dc.subjectCompressive sensingen_US
dc.subjectCross-ambiguity functionen_US
dc.subjectOrthogonal matching pursuiten_US
dc.subjectSparse approximationsen_US
dc.subjectAlgorithmsen_US
dc.subjectParticle swarm optimization (PSO)en_US
dc.subjectSignal reconstructionen_US
dc.subjectMultipath propagationen_US
dc.titleDetection of sparse targets with structurally perturbed echo dictionariesen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage1630en_US
dc.citation.epage1644en_US
dc.citation.volumeNumber23en_US
dc.citation.issueNumber5en_US
dc.identifier.doi10.1016/j.dsp.2013.03.003en_US
dc.publisherElsevieren_US


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