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    • Noise analysis of interdigital cantilevers for atomic force microscopy 

      Yaralıoğlu, G Göksenin (Bilkent University, 1998)
      Atomic force microscoiDe (AFM) is proved to be a powerful tool for atomic resolution surface imaging. The most crucial parts of an AFM system are the cantilever with an integrated tip and the deflection detection sensor. ...