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Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces
(American Institute of Physics Inc., 2015)
The effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic force microscopy measurements of graphitic surfaces has been investigated via numerical simulations. Employing a three-dimensional, ...
Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talk
(American Chemical Society, 2015)
In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip-sample interactions to collect complementary information about the ...
Atomic force microscopy: Methods and applications
This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety ...