Now showing items 1-2 of 2
Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces
(American Institute of Physics Inc., 2015)
The effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic force microscopy measurements of graphitic surfaces has been investigated via numerical simulations. Employing a three-dimensional, ...
Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talk
(American Chemical Society, 2015)
In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip-sample interactions to collect complementary information about the ...