Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy
Author
Balantekin, M.
Atalar, Abdullah
Date
2005Source Title
Applied Physics Letters
Print ISSN
0003-6951
Publisher
AIP
Volume
87
Issue
24
Pages
243513-1 - 243513-3
Language
English
Type
ArticleItem Usage Stats
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Abstract
Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio.
© 2005 American Institute of Physics
Keywords
GenerationCantilever
Atomic Force Microscopy
Imaging Techniques
Nanostructured Materials
Signal To Noise Ratio
Surface Roughness
Nanomechanical Properties
Harmonic Analysis