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      • Department of Electrical and Electronics Engineering
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      Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

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      Author
      Balantekin, M.
      Atalar, Abdullah
      Date
      2005
      Source Title
      Applied Physics Letters
      Print ISSN
      0003-6951
      Publisher
      AIP
      Volume
      87
      Issue
      24
      Pages
      243513-1 - 243513-3
      Language
      English
      Type
      Article
      Item Usage Stats
      130
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      Abstract
      Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio. © 2005 American Institute of Physics
      Keywords
      Generation
      Cantilever
      Atomic Force Microscopy
      Imaging Techniques
      Nanostructured Materials
      Signal To Noise Ratio
      Surface Roughness
      Nanomechanical Properties
      Harmonic Analysis
      Permalink
      http://hdl.handle.net/11693/11411
      Published Version (Please cite this version)
      https://doi.org/10.1063/1.2147708
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      • Department of Electrical and Electronics Engineering 3524
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