Enhanced peak separation in XPS with external biasing

Date
2005-08-15
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Applied Surface Science
Print ISSN
0169-4332
Electronic ISSN
Publisher
Elsevier
Volume
249
Issue
1-4
Pages
12 - 15
Language
English
Journal Title
Journal ISSN
Volume Title
Series
Abstract

We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application of an external voltage bias to the sample rod while recording the XPS spectra. The external bias controls the flow of low-energy electrons falling on to the sample which in-turn controls the extent of the differential charging of the oxide layer leading to shifts in the binding energy of the gold nanoparticles in contact with the layer. The method is simple and effective for enhancing peak separation and identification of hetero-structures. (c) 2004 Elsevier B.V. All rights reserved.

Course
Other identifiers
Book Title
Citation
Published Version (Please cite this version)