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dc.contributor.authorÖzer, H. Ö.en_US
dc.contributor.authorAtabak, M.en_US
dc.contributor.authorOral, A.en_US
dc.date.accessioned2015-07-28T11:57:05Z
dc.date.available2015-07-28T11:57:05Z
dc.date.issued2002-12en_US
dc.identifier.issn0038-1098
dc.identifier.urihttp://hdl.handle.net/11693/11206
dc.description.abstractSi(100)(2 x 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Angstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. (C) 2002 Elsevier Science Ltd. All rights reserved.en_US
dc.language.isoEnglishen_US
dc.source.titleSolid State Communicationsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/S0038-1098(02)00547-1en_US
dc.subjectSi (100) Surfaceen_US
dc.subjectNc-afm/stm Studiesen_US
dc.titleUltra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2x1)en_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.citation.spage469en_US
dc.citation.epage472en_US
dc.citation.volumeNumber124en_US
dc.citation.issueNumber12en_US
dc.instituteSi (100) surface, nc-AFM/STM studiesen_US
dc.identifier.doi10.1016/S0038-1098(02)00547-1en_US
dc.publisherElsevieren_US


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