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      Quantitative atom-resolved force gradient imaging using non contact-AFM/STM

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      Author
      Oral, A.
      Grimble, R. A.
      Ozer, H. O.
      Hoffman, P. M.
      Pethica, J. B.
      Date
      2001
      Source Title
      Applied Physics Letters
      Print ISSN
      0003-6951
      Publisher
      American Institute of Physics
      Volume
      79
      Issue
      12
      Pages
      1915 - 1917
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.
      Keywords
      Scanning-tunneling-microscopy
      Reactive Surfaces
      Tip
      Permalink
      http://hdl.handle.net/11693/10944
      Published Version (Please cite this version)
      http://dx.doi.org/10.1063/1.1389785
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