## Search

Now showing items 1-10 of 33

#### Resonant harmonic response in tapping-mode atomic force microscopy

(American Physical Society, 2004)

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensing material properties at the nanoscale. The signal level at a given harmonic of the fundamental mode can be enhanced if ...

#### Simulations of switching vibrating cantilever in atomic force microscopy

(Elsevier, 2003-01-31)

We analyze the steady state tip sample interaction in atomic force microscopy by using an electrical circuit simulator. The phase shift between the cantilever excitation and tip, and the amplitude versus distance curves ...

#### Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

(AIP, 2005)

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical ...

#### Design of application specific processors for the cached FFT algorithm

(IEEE, 2006-05)

Orthogonal frequency division multiplexing (OFDM) is a data transmission technique which is used in wired and wireless digital communication systems. In this technique, fast Fourier transformation (FFT) and inverse FFT ...

#### Integration of through-wafer interconnects with a two-dimensional cantilever array

(Elsevier, 2000-05-22)

High-density through-wafer interconnects are incorporated in a two-dimensional (2D) micromachined cantilever array. The design addresses alignment and density issues associated with 2D arrays. Each cantilever has piezoresistive ...

#### Design charts to maximize the gain-bandwidth product of capacitive micromachined ultrasonic transducers

(IEEE, 2005)

In this work we define a performance measure for capacitive micromachined ultrasonic transducers (cMUT) in the form of a gain-bandwidth product to investigate the conditions that optimize the gain and bandwidth with respect ...

#### Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator

(AIP Publishing, 2001-05-07)

We present a mechanical model for the atomic force microscope tip tapping on a sample. The model treats the tip as a forced oscillator and the sample as an elasticmaterial with adhesiveproperties. It is possible to transform ...

#### Optimization of the gain-bandwidth product of capacitive micromachined ultrasonic transducers

(IEEE, 2005-12)

Capacitive micromachined ultrasonic transducers (cMUT) have large bandwidths, but they typically have low conversion efficiencies. This paper defines a performance
measure in the form of a gain-bandwidth product and ...

#### Parallel atomic force microscopy with optical interferometric detection

(American Institute of Physics, 2001-01-05)

We have developed an atomic force microscope that uses interferometry for parallel readout of a cantilever array. Each cantilever contains a phase sensitive diffraction grating consisting of a reference and movable set of ...

#### High-speed tapping mode imaging with active Q control for atomic force microscopy

(American Institute of Physics, 2000)

The speed of tapping mode imaging with the atomic force microscope(AFM) has been increased by over an order of magnitude. The enhanced operation is achieved by (1) increasing the instrument’s mechanical bandwidth and (2) ...