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Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy
(AIP Publishing LLC, 2004)
We present a model predicting the effects of mechanical defects at layer interfaces on the contact stiffness measured by ultrasonic atomic force microscopy sAFMd. Defects at subsurface interfaces result in changes at the ...
High-resolution imaging of elastic properties using harmonic cantilevers
We present a micromachined scanning probe cantilever, in which a specific higher-order flexural mode is designed to be resonant at an exact integer multiple of the fundamental resonance frequency. We have fabricated such ...