Now showing items 1-5 of 5
Two-dimensional x-ray photoelectron spectroscopy for composite surface analysis
We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the ...
XPS measurements for probing dynamics of charging
The technique of recording X-ray photoemission data while the sample rod is subjected to ±10.0 V (dc) or square-wave pulses (ac) with varying frequencies in the range of 10-3 to 103 Hz for probing charging/discharging ...
Charging / discharging of thin PS / PMMA films as probed by dynamic x-ray photoelectron spectroscopy
Polystyrene / polymethyl methacrylate (PS-PMMA) thin films were analyzed for detecting phase separation as well as probing their electrical responses by XPS. It was also shown that electrical parameters like resistance or ...
Differentiation of domains in composite surface structures by charge-contrast x-ray photoelectron spectroscopy
An external bias is applied to two samples containing composite surface structures, while recording an XPS spectrum. Altering the polarity of the bias affects the extent of differential charging in domains that are chemically ...
X-ray photoemission for probing charging/discharging dynamics
(American Chemical Society, 2006)
A novel technique is introduced for probing charging/discharging dynamics of dielectric materials in which X-ray photoemission data is recorded while the sample rod is subjected to ± 10.0 V square-wave pulses with varying ...