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Resonant harmonic response in tapping-mode atomic force microscopy
(American Physical Society, 2004)
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensing material properties at the nanoscale. The signal level at a given harmonic of the fundamental mode can be enhanced if ...
Harmonic cantilevers for nanomechanical sensing of elastic properties
(IEEE, 2003-06)
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode is designed to be resonant at an exact integer multiple of the fundamental resonance frequency. We have demonstrated that ...
Power dissipation analysis in tapping-mode atomic force microscopy
(American Physical Society, 2003)
In a tapping-mode atomic force microscope, a power is dissipated in the sample during the imaging process. While the vibrating tip taps on the sample surface, some part of its energy is coupled to the sample. Too much ...
Enhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency
(American Physical Society, 2005-03)
In a tapping-mode atomic force microscope, the frequency spectrum of the oscillating cantilever contains higher harmonics at integer multiples of the excitation frequency. When the cantilever oscillates at its fundamental ...
An optical microcantilever with integrated grating coupler
(IEEE, 2009-06)
In this paper, we have fabricated an optical cantilever with an integrated grating coupler. We have used an inexpensive and repeatable method for integrating the grating to the silicon cantilever with a microfabrication ...
Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy
(AIP Publishing LLC, 2004)
We present a model predicting the effects of mechanical defects at layer interfaces on the contact
stiffness measured by ultrasonic atomic force microscopy sAFMd. Defects at subsurface interfaces
result in changes at the ...
High‐speed atomic force microscopy using an integrated actuator and optical lever detection
(A I P Publishing LLC, 1996-09)
A new procedure for high‐speed imaging with the atomic force microscope that combines an integrated ZnO piezoelectric actuator with an optical lever sensor has yielded an imaging bandwidth of 33 kHz. This bandwidth is ...
Interdigital cantilevers for atomic force microscopy
(A I P Publishing LLC, 1996-10)
We present a sensor for the atomic force microscope (AFM) where a silicon cantilever is micromachined into the shape of interdigitated fingers that form a diffraction grating. When detecting a force, alternating fingers ...
High-resolution imaging of elastic properties using harmonic cantilevers
(Elsevier, 2004)
We present a micromachined scanning probe cantilever, in which a specific higher-order flexural mode is designed to be resonant at an exact integer multiple of the fundamental resonance frequency. We have fabricated such ...