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    • Location and visualization of working p-n and/or n-p junctions by XPS 

      Copuroglu, M.; Caliskan, D.; Sezen, H.; Özbay, Ekmel; Süzer, Şefik (Nature Publishing Group, 2016)
      X-ray photoelectron spectroscopy (XPS) is used to follow some of the electrical properties of a segmented silicon photodetector, fabricated in a p-n-p configuration, during operation under various biasing configurations. ...