Browsing by Keywords "Atomic forces"

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Imaging capability of pseudomorphic high electron mobility transistors, AlGaN/GaN, and Si micro-Hall probes for scanning Hall probe microscopy between 25 and 125 °c

Akram, R.; Dede, M.; Oral, A. (American Vacuum Society, 2009)

The authors present a comparative study on imaging capabilities of three different micro-Hall probe sensors fabricated from narrow and wide band gap semiconductors for scanning hall probe microscopy at variable temperatures. ...
Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

Atabak, M.; Ünverdi O.; Özer H.O.; Oral, A. (2009)

In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning ...