Now showing items 1-2 of 2

    • Band-Bending at buried SiO2/Si interface as probed by XPS 

      Çopuroğlu, M.; Sezen, H.; Opila, R. L.; Süzer, Şefik (American Chemical Society, 2013)
      X-ray photoelectron spectroscopy is used to probe the photoinduced shifts in the binding energies of Si2p, O1s, and C1s of the SiO2/Si interfaces of a number of samples having oxide and/or thin organic layers on top of p- ...
    • Electrical and chemical characterization of chemically passivated silicon surfaces 

      Chhabra, B.; Süzer, Şefik; Opila, R. L.; Honsberg, C. B. (IEEE, 2008)
      The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF ...