Now showing items 1-2 of 2

    • Band-Bending at buried SiO2/Si interface as probed by XPS 

      Çopuroğlu, M.; Sezen, H.; Opila, R. L.; Süzer, Şefik (American Chemical Society, 2013)
      X-ray photoelectron spectroscopy is used to probe the photoinduced shifts in the binding energies of Si2p, O1s, and C1s of the SiO2/Si interfaces of a number of samples having oxide and/or thin organic layers on top of p- ...
    • Tribological interaction between polytetrafluoroethylene and silicon oxide surfaces 

      Uçar, A.; Çopuroğlu, M.; Baykara, M. Z.; Arıkan, Orhan; Süzer, Şefik (AIP Publishing LLC, 2014)
      We investigated the tribological interaction between polytetrafluoroethylene (PTFE) and silicon oxide surfaces. A simple rig was designed to bring about a friction between the surfaces via sliding a piece of PTFE on a ...